Remove mostly-redundant test build
component_test_CID_no_debug was added specifically to be a non-regression test for https://github.com/Mbed-TLS/mbedtls/issues/3998. Running compat.sh in the newly introduced config-ccm-psk-dtls1_2.h is also a non-regression test for that bug. Therefore component_test_CID_no_debug is redundant for its primary purpose. Of course every configuration is different, but the additional coverage from component_test_CID_no_debug is minimal, unlike config-ccm-psk-dtls1_2.h which is a plausible real-world configuration. In mbedtls-2.28, component_test_CID_no_debug was never added, and running the unit tests in that configuration does not trigger the #3998 bug, only compat.sh does. So, rather than backport component_test_CID_no_debug to 2.28.2, I am removing it from 3.2. Signed-off-by: Gilles Peskine <Gilles.Peskine@arm.com>
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@ -2239,18 +2239,6 @@ component_test_variable_ssl_in_out_buffer_len_CID () {
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tests/compat.sh
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}
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component_test_CID_no_debug() {
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msg "build: Connection ID enabled, debug disabled"
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scripts/config.py unset MBEDTLS_DEBUG_C
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scripts/config.py set MBEDTLS_SSL_DTLS_CONNECTION_ID
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CC=gcc cmake .
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make
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msg "test: Connection ID enabled, debug disabled"
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make test
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}
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component_test_ssl_alloc_buffer_and_mfl () {
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msg "build: default config with memory buffer allocator and MFL extension"
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scripts/config.py set MBEDTLS_MEMORY_BUFFER_ALLOC_C
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